Tomographic testing and validation of probabilistic circuits
From Thermodynamics of Computation
- reference groups
- Computer Science Engineering to Address Energy Costs
- author-supplied keywords
- keywords
- authors
- Alexandru Paler
- Armin Alaghi
- Ilia Polian
- John P. Hayes
- title
- Tomographic testing and validation of probabilistic circuits
- type
- conference_proceedings
- year
- 2011
- source
- Proceedings - 16th IEEE European Test Symposium, ETS 2011
- pages
- 63-68
- link
- https://www.mendeley.com/catalogue/dc3a5bb1-f150-36e4-bb5b-1c1c42e9058f/(0)
Counts
- Citation count
- 13
- Page views
- 0
Identifiers
- doi: 10.1109/ETS.2011.43 (Google search)
- sgr: 80051964770
- isbn: 9780769544335
- scopus: 2-s2.0-80051964770
- pui: 362398134
