Tracking uncertainty with probabilistic logic circuit testing
From Thermodynamics of Computation
- reference groups
- Computer Science Engineering to Address Energy Costs
- author-supplied keywords
- Fault-modeling framework
- Integer linear programming
- Logic circuit testing
- Probabilistic faults
- Test-vector sensitivity
- keywords
- authors
- Smita Krishnaswamy
- Igor L. Markov
- John P. Hayes
- title
- Tracking uncertainty with probabilistic logic circuit testing
- type
- journal
- year
- 2007
- source
- IEEE Design and Test of Computers
- pages
- 312-321
- volume
- 24
- issue
- 4
- link
- https://www.mendeley.com/catalogue/b2d31df9-1a94-3455-9ee6-cfd039abd380/(0)
Counts
- Citation count
- 23
- Page views
- 0
Identifiers
- doi: 10.1109/MDT.2007.146 (Google search)
- issn: 07407475
- sgr: 49549090550
- scopus: 2-s2.0-49549090550
- pui: 354528736
