Santa Fe Institute Collaboration Platform

Thermodynamics of Computation

Tracking uncertainty with probabilistic logic circuit testing

From Thermodynamics of Computation
reference groups
Computer Science Engineering to Address Energy Costs
author-supplied keywords
Fault-modeling framework
Integer linear programming
Logic circuit testing
Probabilistic faults
Test-vector sensitivity
keywords
authors
Smita Krishnaswamy
Igor L. Markov
John P. Hayes
title
Tracking uncertainty with probabilistic logic circuit testing
type
journal
year
2007
source
IEEE Design and Test of Computers
pages
312-321
volume
24
issue
4
link
https://www.mendeley.com/catalogue/b2d31df9-1a94-3455-9ee6-cfd039abd380/(Error!"Error!" is not a number.)

Counts

Citation count
24
Page views
0

Identifiers

  • doi: 10.1109/MDT.2007.146 (Google search)
  • issn: 07407475
  • sgr: 49549090550
  • scopus: 2-s2.0-49549090550
  • pui: 354528736